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Thin-Film Study using Low-Incidence and Bragg–Brentano Texture Goniometry. Application to Mono- and Bilayers of Al and Al/Fe by Tizliouine, A. ;Bessières, J. ;Heizmann, J. J. ;Bobo, J. F. is a Materials Science article available to read on EtoBox.

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Author
Tizliouine, A. ;Bessières, J. ;Heizmann, J. J. ;Bobo, J. F.
Publisher
International Union of Crystallography; Blackwell Publishing Inc.; International Union of Crystallography (IUCr) (ISSN 0021-8898)
Published
1996
Language
EN
Field
Materials Science (Physical Sciences)

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