Opening book details…
About this Materials Science article
Characterization of the poly(para-phenylene vinylene)-chromium interface by attenuated total reflection infrared and X-ray emission spectroscopies by T.P. Nguyen; P. Jonnard; F. Vergand; P.F. Staub; J. Thirion; M. Łapkowski; V.H. Tran is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- T.P. Nguyen; P. Jonnard; F. Vergand; P.F. Staub; J. Thirion; M. Łapkowski; V.H. Tran
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0379-6779)
- Published
- 1995
- Field
- Materials Science (Physical Sciences)