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About this Engineering article
Traps Induced Memory Effect in Rubrene Single Crystal Phototransistor by Li, Aiyuan; Wei, Xiaoyun; He, Yaowu; He, Chao; Ali, Muhammad Umair; Yang, Huai; Goto, Osamu; Meng, Hong is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Li, Aiyuan; Wei, Xiaoyun; He, Yaowu; He, Chao; Ali, Muhammad Umair; Yang, Huai; Goto, Osamu; Meng, Hong
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2018
- Language
- EN
- Field
- Engineering (Physical Sciences)