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About this Engineering article
Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs by Kastensmidt, F.L.; Tonfat, J.; Both, T.; Rech, P.; Wirth, G.; Reis, R.; Bruguier, F.; Benoit, P.; Torres, L.; Frost, C. is a Engineering article available to read on EtoBox.
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- Author
- Kastensmidt, F.L.; Tonfat, J.; Both, T.; Rech, P.; Wirth, G.; Reis, R.; Bruguier, F.; Benoit, P.; Torres, L.; Frost, C.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2014
- Language
- EN
- Field
- Engineering (Physical Sciences)