About this scholarly article

AIP Conference Proceedings [AIP PHYSICS OF SEMICONDUCTORS: 30th International Conference on the Physics of Semiconductors - Seoul, (Korea) (25–30 July 2010)] - Nanometer-scale Mapping of Dielectric Constant of Ge∕Si Quantum Dots by Using Apertureless Near-field Scanning Optical Microscopy by Ogawa, Y.; Nakajima, D.; Minami, F.; Abate, Yohannes; Leone, Stephen R.; Ihm, Jisoon; Cheong, Hyeonsik is a scholarly article available to read on EtoBox.

Author

Ogawa, Y.; Nakajima, D.; Minami, F.; Abate, Yohannes; Leone, Stephen R.; Ihm, Jisoon; Cheong, Hyeonsik

Publisher

AIP

Published

2011

Language

EN