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RC-Triggered ESD Clamp for BCD CMOS by xinlivu is a document available to read on EtoBox.
The paper presents a novel RC-triggered ESD clamp designed for high-voltage BCD CMOS processes, addressing limitations in traditional protection schemes that require digital circuits. The proposed architecture utilizes a simple two-stage design to achieve effective ESD protection without the need for additional digital components, making it suitable for environments with restricted gate-to-source voltage. Simulation results indicate that the design can provide Class 3A-level ESD protection while maintaining
- Author
- xinlivu
- Language
- EN