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About this Engineering article
Fault line detection method based on the improved SVD de‐noising and ideal clustering curve for distribution networks by Wei, Xiangxiang; Wen, Boying; Yang, Dechang; Wang, Bin; Wang, Xiaowei; Yang, Xuefei; Gao, Jie is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Wei, Xiangxiang; Wen, Boying; Yang, Dechang; Wang, Bin; Wang, Xiaowei; Yang, Xuefei; Gao, Jie
- Publisher
- The Institution of Engineering and Technology; Institution of Electrical Engineers; Institution of Engineering and Technology; Institution of Engineering and Technology (IET) (ISSN 1751-8822)
- Published
- 2018
- Field
- Engineering (Physical Sciences)