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About this Engineering article
Behavior of Stacking Faults in ß-SiC - Mechanism of Annihilation and Additive Effects - by Seo, W.S.; Pai, C.H.; Koumoto, Kunihito; Yanagida, H. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Seo, W.S.; Pai, C.H.; Koumoto, Kunihito; Yanagida, H.
- Publisher
- Trans Tech Publications, Ltd.; Scientific.net; Scitec Publications Ltd. (ISSN 1662-9779)
- Published
- 1992
- Field
- Engineering (Physical Sciences)
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