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Determination of crystal orientation by an area-detector image for surface X-ray diffraction by Wataru Yashiro; Shuji Kusano; Kazushi Miki is a Materials Science article available to read on EtoBox.

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A new method of calculating the crystal orientation matrix (**U**matrix) of a specified sample using two-dimensional X-ray diffraction spots that are recorded on an area detector is presented. In this way, the**U**matrix is calculated using at least three two-dimensional diffraction spots of known two-dimensional indices, which provide the projection of the crystal truncation rod onto the detector. The method, in the case of surface X-ray diffraction measurements with an area detector, enables easier and faster sample alignment than the conventional method to determine the**U**matrix.

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Author

Wataru Yashiro; Shuji Kusano; Kazushi Miki

Publisher

International Union of Crystallography; Blackwell Publishing Inc.; International Union of Crystallography (IUCr) (ISSN 0021-8898)

Published

2005

Language

EN

Field

Materials Science (Physical Sciences)