About this scholarly article

2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) - Robust memory cell capacitor using multi-stack storage node for high performance in 90 nm technology and beyond by Jaegoo Lee, ; Yongseok Ahn, ; Yangkeun Park, ; Minsang Kim, ; Dongjun Lee, ; Kyuhyun Lee, ; Changhyun Cho, ; Taeyoung Chung, ; Kinam Kim, is a scholarly article available to read on EtoBox.

Author

Jaegoo Lee, ; Yongseok Ahn, ; Yangkeun Park, ; Minsang Kim, ; Dongjun Lee, ; Kyuhyun Lee, ; Changhyun Cho, ; Taeyoung Chung, ; Kinam Kim,

Publisher

Japan Soc. Applied Phys

Published

2003

Language

EN