About this scholarly article

SPIE Proceedings [SPIE Laser-Induced Damage in Optical Materials: 1995 - Boulder, CO (Monday 30 October 1995)] 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995 - Accuracy and precision of laser damage measurements made via binary search techniques by Arenberg, Jonathan W.; Bennett, Harold E.; Guenther, Arthur H.; Kozlowski, Mark R.; Newnam, Brian E.; Soileau, M. J. is a scholarly article available to read on EtoBox.

Author

Arenberg, Jonathan W.; Bennett, Harold E.; Guenther, Arthur H.; Kozlowski, Mark R.; Newnam, Brian E.; Soileau, M. J.

Publisher

SPIE

Published

1996