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About this Engineering article
Comparative analysis of oxide phase formation and its effects on electrical properties of SiO2/InSb metal-oxide-semiconductor structures by Jaeyel Lee; Sehun Park; Jungsub Kim; Changjae Yang; Sujin Kim; Chulkyun Seok; Jinsub Park; Euijoon Yoon is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Jaeyel Lee; Sehun Park; Jungsub Kim; Changjae Yang; Sujin Kim; Chulkyun Seok; Jinsub Park; Euijoon Yoon
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 2012
- Field
- Engineering (Physical Sciences)