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About this Engineering article
Validation de Séquences de Test Fonctionnel de Microprocesseurs by Jean-Yves Le Moing; Gilles Motet; Pierre Vergez is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Jean-Yves Le Moing; Gilles Motet; Pierre Vergez
- Publisher
- Springer-Verlag; Springer Verlag; Springer Science and Business Media LLC (ISSN 0003-4347)
- Published
- 1988
- Field
- Engineering (Physical Sciences)
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