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About this Engineering article
Corrosion-induced Degradation of Microelectronic Devices by J. W. Osenbach is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- J. W. Osenbach
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0268-1242)
- Published
- 1996
- Language
- EN
- Field
- Engineering (Physical Sciences)