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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, United States (Sunday 8 February 2015)] Image Processing: Machine Vision Applications VIII - Self-calibration of monocular vision system based on planar points by Lam, Edmund Y.; Niel, Kurt S.; Zhao, Yu; Xu, Lichao is a scholarly article available to read on EtoBox.

Author
Lam, Edmund Y.; Niel, Kurt S.; Zhao, Yu; Xu, Lichao
Publisher
SPIE
Published
2015
Language
EN

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