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Solving modulated structures by X-ray and electron crystallography by M.T. Caldes; P. Deniard; X.D. Zou; R. Marchand; N. Diot; R. Brec is a Engineering article available to read on EtoBox.
What is Solving modulated structures by X-ray and electron crystallography about?
X-ray diffraction can be used for accurately determining not only classical, ordinary structures, but also modulated ones. For structures with weak modulations, the modulation induced satellite reflections are often hard to be observed by X-ray diffraction, but they appear clearly in electron diffraction. In these cases, X-ray diffraction will give only average structures whereas electron diffraction will yield information about the modulations. Sr(1.4)Ta(0.6)O(2.9) is a complex modulated compound with weak modulation and small modulated domains. Here we demonstrate the power of combining X-ray and electron crystallography for studying modulated structures on powders. The modulations of Sr(1.4)Ta(0.6)O(2.9) were determined from electron diffraction (SAED) and high resolution electron microscopy (HREM) images. With specially developed image processing techniques, the weak modulations were enhanced, facilitating the interpretation of HREM images in terms of atomic structure.
Who reads Solving modulated structures by X-ray and electron crystallography?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- M.T. Caldes; P. Deniard; X.D. Zou; R. Marchand; N. Diot; R. Brec
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0968-4328)
- Published
- 2001
- Language
- EN
- Field
- Engineering (Physical Sciences)
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