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About this Physics and Astronomy article
Charging characteristics of Si nanocrystals embedded within SiO2in the presence of near-interface oxide traps by Ioannou-Sougleridis, V; Nassiopoulou, A G is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Ioannou-Sougleridis, V; Nassiopoulou, A G
- Publisher
- Institute of Physics; IOP Publishing (ISSN 1742-6588)
- Published
- 2005
- Field
- Physics and Astronomy (Physical Sciences)
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