About this scholarly article

2007 IEEE International Conference on Microelectronic Test Structures - A Continuous Model for MOSFET VT Matching Considering Additional Length Effects by Bordez, Samuel; Cathignol, Augustin; Rochereau, Krysten is a scholarly article available to read on EtoBox.

Author

Bordez, Samuel; Cathignol, Augustin; Rochereau, Krysten

Publisher

IEEE

Published

2007

Language

EN