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About this Computer Science article
Custom Microelectronics: the Risk Factor by S.L. Hurst is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- S.L. Hurst
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0141-9331)
- Published
- 1990
- Language
- EN
- Field
- Computer Science (Physical Sciences)