About this Materials Science article
Study of the chemical and structural organization of SIPOS films at the nanometer scale by TEM–EELS and XPS by S Schamm; R Berjoan; P Barathieu is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- S Schamm; R Berjoan; P Barathieu
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd; Elsevier BV (ISSN 0921-5107)
- Published
- 2004
- Language
- EN
- Field
- Materials Science (Physical Sciences)