About this scholarly article

2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Analog test metrics estimates with PPM accuracy by Stratigopoulos, Haralampos-G.; Mir, Salvador is a scholarly article available to read on EtoBox.

Author

Stratigopoulos, Haralampos-G.; Mir, Salvador

Publisher

IEEE

Published

2010