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About this Engineering article

Evaluation of voltage vs. pulse width modulation and feedback during set/reset verify-programming to achieve 10 million cycles for 50nm HfO2 ReRAM by Higuchi, Kazuhide; Takeuchi, Ken; Iwasaki, Tomoko Ogura is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Higuchi, Kazuhide; Takeuchi, Ken; Iwasaki, Tomoko Ogura
Publisher
Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0038-1101)
Published
2014
Field
Engineering (Physical Sciences)