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About this Engineering article
Analysis of Local Creep Strain Field and Cracking Process in Claystone by X-Ray Micro-Tomography and Digital Volume Correlation by Shi, Hai-Ling (author);Hosdez, Jerome (author);Rougelot, Thomas (author);Xie, Shou-Yi (author);Shao, Jian-Fu (author);Talandier, Jean (author) is a Engineering article available to read on EtoBox.
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- Author
- Shi, Hai-Ling (author);Hosdez, Jerome (author);Rougelot, Thomas (author);Xie, Shou-Yi (author);Shao, Jian-Fu (author);Talandier, Jean (author)
- Publisher
- Springer Science and Business Media LLC
- Published
- 2021
- Field
- Engineering (Physical Sciences)