About this scholarly article

2019 IEEE 15th International Conference on Automation Science and Engineering (CASE) - DefectGAN: Weakly-Supervised Defect Detection using Generative Adversarial Network by Niu, Shuanlong; Lin, Hui; Niu, Tongzhi; Li, Bin; Wang, Xinggang is a scholarly article available to read on EtoBox.

Author

Niu, Shuanlong; Lin, Hui; Niu, Tongzhi; Li, Bin; Wang, Xinggang

Publisher

IEEE

Published

2019