About this scholarly article

International Conference on Wafer Scale Integration - San Francisco, CA, USA (22-24 Jan. 1992)] [1992] Proceedings International Conference on Wafer Scale Integration - A wafer scale dynamic thermal scene generator by Chapman, G.H.; Parameswaran, M.; Syrzycki, M.J. is a scholarly article available to read on EtoBox.

Author

Chapman, G.H.; Parameswaran, M.; Syrzycki, M.J.

Publisher

IEEE Comput. Soc. Press

Published

1992

Language

EN