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About this Materials Science article
Magneto resistance due to domain wall scattering and magneto size effect of thin Ni and Co films at low temperatures by Y.C. Yeh; J.T. Lue; T.Y. Chen; J.H. Liu is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Y.C. Yeh; J.T. Lue; T.Y. Chen; J.H. Liu
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0304-8853)
- Published
- 2006
- Language
- EN
- Field
- Materials Science (Physical Sciences)