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About this Engineering article
Reliability issues of GaN based high voltage power devices by J. Wuerfl; E. Bahat-Treidel; F. Brunner; E. Cho; O. Hilt; P. Ivo; A. Knauer; P. Kurpas; R. Lossy; M. Schulz; S. Singwald; M. Weyers; R. Zhytnytska is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- J. Wuerfl; E. Bahat-Treidel; F. Brunner; E. Cho; O. Hilt; P. Ivo; A. Knauer; P. Kurpas; R. Lossy; M. Schulz; S. Singwald; M. Weyers; R. Zhytnytska
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2011
- Field
- Engineering (Physical Sciences)