About this scholarly article

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California (Sunday 1 August 2010)] Advances in Metrology for X-Ray and EUV Optics III - Using the power spectral density method to characterise the surface topography of optical surfaces by Alcock, Simon G.; Ludbrook, Geoff D.; Owen, Tommy; Dockree, Richard; Assoufid, Lahsen; Takacs, Peter Z.; Asundi, Anand K. is a scholarly article available to read on EtoBox.

Author

Alcock, Simon G.; Ludbrook, Geoff D.; Owen, Tommy; Dockree, Richard; Assoufid, Lahsen; Takacs, Peter Z.; Asundi, Anand K.

Publisher

SPIE

Published

2010

Language

EN