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About this Engineering article
Characterisation of Retention Properties of Charge-trapping Memory Cells at Low Temperatures by Yurchuk, E; Bollmann, J; Mikolajick, T is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Yurchuk, E; Bollmann, J; Mikolajick, T
- Publisher
- IOP Publishing (ISSN 1757-8981)
- Published
- 2009
- Language
- EN
- Field
- Engineering (Physical Sciences)