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About this Engineering article
On the Relation Between Growth Instabilities and Internal Stress Evolution during Galvanostatic Ti Thin Film Anodization by Vanhumbeeck, J.-F.; Proost, J. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Vanhumbeeck, J.-F.; Proost, J.
- Publisher
- The Electrochemical Society; Electrochemical Society, Inc. (ISSN 0013-4651)
- Published
- 2008
- Language
- EN
- Field
- Engineering (Physical Sciences)