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Achieving Metrological Precision Limits Through Post-selection by Alves, G. Bié; Pimentel, A.; Hor-Meyll, M.; Walborn, S. P.; Davidovich, L.; Filho, R. L. de Matos is a scholarly article available to read on EtoBox.

What is Achieving Metrological Precision Limits Through Post-selection about?

Post-selection strategies have been proposed with the aim of amplifying weak signals, which may help to overcome detection thresholds associated with technical noise in high-precision measurements. Here we use an optical setup to experimentally explore two different post-selection protocols for the estimation of a small parameter: a weak-value amplification procedure and an alternative method, that does not provide amplification, but nonetheless is shown to be more robust for the sake of parameter estimation. Each technique leads approximately to the saturation of quantum limits for the estimation precision, expressed by the Cram\'er-Rao bound. For both situations, we show that information on the parameter is obtained jointly from the measuring device and the post-selection statistics.

Author

Alves, G. Bié; Pimentel, A.; Hor-Meyll, M.; Walborn, S. P.; Davidovich, L.; Filho, R. L. de Matos

Published

2016

Language

EN