About this document
Devan Nano Report1 by devan280406 is a document available to read on EtoBox.
The report investigates the X-ray diffraction (XRD) patterns of copper and silver samples to determine their crystallite parameters. The results indicate that the copper sample contains impurities, as evidenced by additional peaks not present in the standard XRD, while the silver sample closely matches the standard, suggesting purity. Average lattice parameters were calculated as 0.365 nm for copper and 0.4056 nm for silver.
- Author
- devan280406
- Language
- EN