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About this Engineering article
Characterization of Metal/Ferroelectric/Insulator/Semiconductor Structure with $\bf CeO_{2}$ Buffer Layer by Hirai, Tadahiko; KazuhiroTeramoto, ; Nagashima, Kazuhito; Koike, Hiroshi; Tarui, Yasuo is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Hirai, Tadahiko; KazuhiroTeramoto, ; Nagashima, Kazuhito; Koike, Hiroshi; Tarui, Yasuo
- Publisher
- Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
- Published
- 1995
- Language
- EN
- Field
- Engineering (Physical Sciences)