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HBM Failure Diagnosis on a High-Frequency Analog Design with Full-chip Dynamic ESD Simulation by Tong, Paul (author);Tam, Anna (author);Xu, Ping Ping (author);Lin, K S (author);Hui, John (author);Chang, Norman (author);Hu, Bo (author);Srinivasan, Karthik (author);Schmitt, Margaret (author) is a scholarly article available to read on EtoBox.

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Tong, Paul (author);Tam, Anna (author);Xu, Ping Ping (author);Lin, K S (author);Hui, John (author);Chang, Norman (author);Hu, Bo (author);Srinivasan, Karthik (author);Schmitt, Margaret (author)