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Can I read Electromigration in Metals : Fundamentals to Nano-interconnects on EtoBox?
Electromigration in Metals : Fundamentals to Nano-interconnects by Paul S. Ho, Chao-Kun Hu, Martin Gall, Valeriy Sukharev, Paul Ho is a science book available to read on EtoBox.
What is Electromigration in Metals : Fundamentals to Nano-interconnects about?
Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. Through a detailed review on the role of microstructure, interfaces and processing on electromigration reliability, as well as characterisation, testing and analysis, the book follows the development of on-c
Who reads Electromigration in Metals : Fundamentals to Nano-interconnects?
It is typically read by self-directed learners exploring a subject in depth.
Common subject areas: history, science, philosophy, social sciences.
- Author
- Paul S. Ho, Chao-Kun Hu, Martin Gall, Valeriy Sukharev, Paul Ho
- Publisher
- Cambridge University Press (Virtual Publishing)
- Published
- 2022
- Language
- EN
- ISBN
- 9781107032385
- Category
- science
- Subjects
- Engineering, Physics, Science
- Updated
- 2026-03-25
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