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Gradual Degradation of InGaAs LEDs: Impact on Non-Radiative Lifetime and Extraction of Defect Characteristics by Buffolo, Matteo (author);Magri, Alessandro (author);De Santi, Carlo (author);Meneghesso, Gaudenzio (author);Zanoni, Enrico (author);Meneghini, Matteo (author) is a Engineering article available to read on EtoBox.

What is Gradual Degradation of InGaAs LEDs: Impact on Non-Radiative Lifetime and Extraction of Defect Characteristics about?

We present a detailed analysis of the gradual degradation mechanisms of InGaAs Light-Emitting Diodes (LEDs) tuned for optical emission in the 1.45–1.65 μm range. Specifically, we propose a simple and effective methodology for estimating the relative changes in non-radiative lifetime, and a procedure for extracting the properties of defects responsible for Shockley-Read-Hall recombination. By means of a series of accelerated aging experiments, during which we evaluated the variations of the optical and electrical characteristics of three different families of LEDs, we were able to identify the root causes of device degradation. Specifically, the experimental results show that, both for longer stress time at moderate currents or for short-term stress under high injection levels, all the devices are affected: (i) by a partial recovery of the optical emission at the nominal bias current; and (ii) by a decrease in the emission in low-bias regime. This second process was deeply investigated, and was found to be related to the decrease in the non-radiative Shockley-Read-Hall (SRH) lifetime due to the generation/propagation of defects within the active region of the LEDs. Devices tuned for

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It is typically read by researchers, students, and practitioners in Engineering.

Author
Buffolo, Matteo (author);Magri, Alessandro (author);De Santi, Carlo (author);Meneghesso, Gaudenzio (author);Zanoni, Enrico (author);Meneghini, Matteo (author)
Publisher
MDPI AG
Published
2021
Language
EN
Field
Engineering (Physical Sciences)

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