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Thickness effect of NiO on the performance of ultraviolet sensors with p-NiO/n-ZnO nanowire heterojunction structure by Li, Yu-Ren; Wan, Chung-Yun; Chang, Chia-Tsung; Tsai, Wan-Lin; Huang, Yu-Chih; Wang, Kuang-Yu; Yang, Po-Yu; Cheng, Huang-Chung is a Engineering article available to read on EtoBox.

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Author
Li, Yu-Ren; Wan, Chung-Yun; Chang, Chia-Tsung; Tsai, Wan-Lin; Huang, Yu-Chih; Wang, Kuang-Yu; Yang, Po-Yu; Cheng, Huang-Chung
Publisher
Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0042-207X)
Published
2015
Field
Engineering (Physical Sciences)

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