About this scholarly article

Improved Random Pattern Delay Fault Coverage Using Inversion Test Points by Roy, Soham ;Stiene, Brandon ;Millican, Spencer K. ;Agrawal, Vishwani D. is a scholarly article available to read on EtoBox.

Author

Roy, Soham ;Stiene, Brandon ;Millican, Spencer K. ;Agrawal, Vishwani D.

Publisher

IEEE

Published

2019