About this scholarly article

ECS Transactions - 3D Wafer-Scale Integration for RF and Digital Applications by Chang-Chien, Patty; Gutierrez-Aitken, Augusto; Sandhu, Rajinder; Hennig, Kelly; Scott, Dennis; Zhou, Joe; Nam, Peter; Geiger, Craig; Poust, Ben; Parlee, Mattew; Thai, K.; Phan, W.; Oyama, B. is a scholarly article available to read on EtoBox.

Author

Chang-Chien, Patty; Gutierrez-Aitken, Augusto; Sandhu, Rajinder; Hennig, Kelly; Scott, Dennis; Zhou, Joe; Nam, Peter; Geiger, Craig; Poust, Ben; Parlee, Mattew; Thai, K.; Phan, W.; Oyama, B.

Publisher

ECS

Published

2008

Language

EN