About this scholarly article

2008 19th International Conference on Pattern Recognition - Boosting performance for 2D Linear Discriminant Analysis via regression by Nam Nguyen, ; Liu, Wanquan; Venkatesh, Svetha is a scholarly article available to read on EtoBox.

Author

Nam Nguyen, ; Liu, Wanquan; Venkatesh, Svetha

Publisher

IEEE

Published

2008

Language

EN