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High-Resolution X-ray CT System Development by Daniele Cavalcante is a document available to read on EtoBox.

A high spatial resolution X-ray computed tomography (CT) system has been developed at SPring-8, utilizing an in-vacuum type undulator and a liquid nitrogen cooled monochromator. The system achieved micrometer-order spatial resolution, successfully capturing three-dimensional images of materials such as amorphous silica powders and Sn–Pb eutectic alloys. The experiments demonstrated effective pixel sizes of 0.5 mm x 0.5 mm and 1.0 mm x 1.0 mm, with a spatial resolution of at least a few micrometers.

Author

Daniele Cavalcante

Language

EN