About this scholarly article

Proceedings of the conference on Design, automation and test in Europe - DATE '00 - On applying incremental satisfiability to delay fault testing by Kim, Joonyoung; Whittemore, Jesse; Marques-Silva, João P.; Sakallah, Karem is a scholarly article available to read on EtoBox.

Author

Kim, Joonyoung; Whittemore, Jesse; Marques-Silva, João P.; Sakallah, Karem

Publisher

ACM Press

Published

2000