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About this Engineering article
Characterization of PbSnSe/CdTe/Si (211) Epilayers Grown by Molecular Beam Epitaxy by X.J. Wang; C. Fulk; F.H. Zhao; D.H. Li; S. Mukherjee; Y. Chang; R. Sporken; R. Klie; Z. Shi; C.H. Grein; S. Sivananthan is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- X.J. Wang; C. Fulk; F.H. Zhao; D.H. Li; S. Mukherjee; Y. Chang; R. Sporken; R. Klie; Z. Shi; C.H. Grein; S. Sivananthan
- Publisher
- Springer US; Springer-Verlag; Springer New York LLC; Springer Science and Business Media LLC (ISSN 0361-5235)
- Published
- 2008
- Field
- Engineering (Physical Sciences)