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About this Engineering article
Performance Analysis of Silicon Nanowire Transistors Considering Effective Oxide Thickness of High- K Gate Dielectric by Chandra, S. Theodore; Balamurugan, N. B. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chandra, S. Theodore; Balamurugan, N. B.
- Publisher
- IOP Publishing; Institute of Physics Publishing (ISSN 1674-4926)
- Published
- 2014
- Language
- EN
- Field
- Engineering (Physical Sciences)
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