About this scholarly article

2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Advanced 300mm 130nm BCD technology from 5V to 85V with Deep-Trench Isolation by Chil, Mun Nam; Yang, Ong Shiang; Ke, Dong; Mo, Koo Jeoung; Kun, Liu; Tiong, Michael; Purakh, Raj Verma; Nair, Rajesh is a scholarly article available to read on EtoBox.

Author

Chil, Mun Nam; Yang, Ong Shiang; Ke, Dong; Mo, Koo Jeoung; Kun, Liu; Tiong, Michael; Purakh, Raj Verma; Nair, Rajesh

Publisher

IEEE

Published

2016

Language

EN