About this scholarly article

SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, CA (Sunday 31 July 2005)] Advances in Metrology for X-Ray and EUV Optics - Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories by Assoufid, Lahsen; Rommeveaux, Amparo; Ohashi, Haruhiko; Yamauchi, Kazuto; Mimura, Hidekazu; Qian, Jun; Hignette, Olivier; Ishikawa, Tetsuya; Morawe, Christian; Macrander, Albert; Khounsary, Ali; Goto, Shunji; Assoufid, Lahsen; Takacs, Peter Z.; Taylor, John S. is a scholarly article available to read on EtoBox.

Author

Assoufid, Lahsen; Rommeveaux, Amparo; Ohashi, Haruhiko; Yamauchi, Kazuto; Mimura, Hidekazu; Qian, Jun; Hignette, Olivier; Ishikawa, Tetsuya; Morawe, Christian; Macrander, Albert; Khounsary, Ali; Goto, Shunji; Assoufid, Lahsen; Takacs, Peter Z.; Taylor, John S.

Publisher

SPIE

Published

2005