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Characterization of bulk GaN grown by sublimation technique by Naoi, Y; Kobatake, K; Kurai, S; Nishino, K; Sato, H; Nozaki, M; Sakai, S; Shintani, Y is a Engineering article available to read on EtoBox.
What is Characterization of bulk GaN grown by sublimation technique about?
We have characterized a bulk GaN grown by sublimation technique by means of the high resolution X-ray diffraction measurements, the secondary ion mass spectrometry measurements, the Raman spectroscopy measurements and the resistivity measurements. The results indicated that a bulk GaN was of relatively high purity with a very high crystal perfection.
Who reads Characterization of bulk GaN grown by sublimation technique?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Naoi, Y; Kobatake, K; Kurai, S; Nishino, K; Sato, H; Nozaki, M; Sakai, S; Shintani, Y
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0022-0248)
- Published
- 1998
- Language
- EN
- Field
- Engineering (Physical Sciences)