About this scholarly article

Digest of Papers. 1992 IEEE VLSI Test Symposium - Optimum redundancy design for new-generation EPROMs based on yield analysis of previous generation by Imamiya, K.; Miyamoto, J.; Ohtuska, N.; Tomita, N.; Iyama, Y. is a scholarly article available to read on EtoBox.

Author

Imamiya, K.; Miyamoto, J.; Ohtuska, N.; Tomita, N.; Iyama, Y.

Publisher

IEEE

Published

1992

Language

EN