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About this Engineering article
Interface recombination velocity measurement in SiO2/Si by Ilahi, S.; Yacoubi, N. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Ilahi, S.; Yacoubi, N.
- Publisher
- Springer; Pleiades Publishing; Pleiades Publishing Ltd (ISSN 1063-7826)
- Published
- 2014
- Field
- Engineering (Physical Sciences)