About this scholarly article

SPIE Proceedings [SPIE Optical Systems Design - Glasgow, Scotland, United Kingdom (Monday 1 September 2008)] Optical Fabrication, Testing, and Metrology III - Optical roughness measurements on specially designed roughness standards by Danzl, R.; Duparré, Angela; Geyl, Roland; Helmli, F.; Rubert, P.; Prantl, M. is a scholarly article available to read on EtoBox.

Author

Danzl, R.; Duparré, Angela; Geyl, Roland; Helmli, F.; Rubert, P.; Prantl, M.

Publisher

SPIE

Published

2008

Language

EN